Reliability Lifetime Distribution of IGBT Module Based on K-S Test and ALTA

doi:10.3969/j.issn.1674-0696.2019.01.19

Journal of Chongqing Jiaotong University(Natural Science) ›› 2019, Vol. 38 ›› Issue (01): 119-124.DOI: 10.3969/j.issn.1674-0696.2019.01.19

• Vehicle &Electromechanical Engineering • Previous Articles Next Articles

Reliability Lifetime Distribution of IGBT Module Based on K-S Test and ALTA

WU Huawei1, YE Congjin1,2, NIE Jinquan1

(1. Hubei Key Laboratory of Power System Design and Test for Electrical Vehicle, Xiangyang 441053, Hubei, P. R. China; 2. School of Machinery and Automation, Wuhan University of Science and Technology, Wuhan 430081, Hubei, P. R. China)

Received:2017-06-12 Revised:2017-11-03 Online:2019-01-15 Published:2019-01-14

基于K-S检验法和ALTA的IGBT模块可靠性寿命分布研究

吴华伟1，叶从进1,2，聂金泉1

(1. 纯电动汽车动力系统设计与测试湖北省重点实验室，湖北襄阳 441053； 2. 武汉科技大学机械自动化学院，湖北武汉 430081)

作者简介:吴华伟（1979—），男，湖北襄阳人，副教授，博士，主要从事机电系统设计和故障诊断方面的研究。E-mail: whw_xy@163.com。通信作者：叶从进（1990—），男，湖北黄冈人，硕士研究生，主要从事电机控制方面的研究。E-mail: 964898105@qq.com。
基金资助:
国家自然科学基金项目（11704110）；湖北省技术创新专项重大基金项目（2017AAA133）；湖北省优势特色学科群开放基金项目（XKQ2017008）

Abstract

Abstract: In order to obtain the life information of insulated gate bipolar transistor (IGBT) and determine its life distribution, a new method was proposed to study the accelerated life test data of IGBT modules by means of Kolmogorov-Smirnov test and accelerated life testing data analysis software (ALTA). Firstly, the lifetime of IGBT module was assumed to obey lognormal distribution. Secondly, a group of IGBT accelerated life data were tested, compared and analyzed by Weibull and log-normal distribution test by using K-S test. Furthermore, the acceleration lifetime data of another group of IGBT were simulated and analyzed by ALTA.The results show that the IGBT lifetime is followed by log-normal distribution under the Arrhenius acceleration model. This proposed method makes it possible to quickly estimate the lifetime of IGBT module.

Key words: mechanical and electrical engineering, IGBT module, accelerated lifetime test, log-normal distribution, Kolmogorov-Smirnov test

摘要： 为了获得绝缘栅双极晶体管(insulated gate bipolar transistor,IGBT)的寿命信息及确定其寿命分布，提出了一种利用Kolmogorov-Smirnov检验法和加速寿命测试数据分析软件(accelerated life testing dataanalysissoftware,ALTA)对其加速寿命试验数据进行研究的新方法。该方法首先对IGBT模块寿命做对数正态分布假设，然后利用K-S检验法对一组IGBT加速寿命数据进行Weibull、对数正态等分布检验对比分析，进而利用ALTA对另一组IGBT加速寿命数据进行仿真分析，结果表明在阿伦尼斯(Arrhenius)加速模型下，IGBT模块寿命服从对数正态分布。该方法使得快速估算IGBT模块寿命成为可能。

关键词: 机电工程, IGBT模块, 加速寿命试验, 对数正态分布, Kolmogorov-Smirnov检验

CLC Number:

TB114
TN32

WU Huawei1, YE Congjin1,2, NIE Jinquan1. Reliability Lifetime Distribution of IGBT Module Based on K-S Test and ALTA[J]. Journal of Chongqing Jiaotong University(Natural Science), 2019, 38(01): 119-124.

吴华伟1，叶从进1,2，聂金泉1. 基于K-S检验法和ALTA的IGBT模块可靠性寿命分布研究[J]. 重庆交通大学学报（自然科学版）, 2019, 38(01): 119-124.

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Reliability Lifetime Distribution of IGBT Module Based on K-S Test and ALTA

基于K-S检验法和ALTA的IGBT模块可靠性寿命分布研究

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